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Ti_xV_(1-x)O_2薄膜的光学及相变特性
胡文亮; 徐刚; 马健伟; 熊斌; 史继富
2012
Source Publication物理化学学报
ISSN1000-6818
Volume028Issue:006Pages:1533
Abstract采用射频磁控溅射方法,在c-Al2O3(0001)基底上制备了不同钒钛比例的TixV1-xO2(0≤x≤1)薄膜,利用X射线衍射(XRD)、拉曼(Raman)光谱、紫外-可见-近红外(UV-Vis-NIR)光谱对薄膜结构及光学性能进行测试分析,计算薄膜的太阳能智能调节率和光学带隙.实验结果及分析表明:随着Ti含量的增加,薄膜的红外调节特性和热滞特性逐渐减弱直至消失;薄膜样品的光学带隙随着Ti含量的增加而变宽,光响应范围发生蓝移;其光学带隙随着V含量的增加而变窄,光响应范围发生红移.
Language英语
Document Type期刊论文
Identifierhttp://ir.giec.ac.cn/handle/344007/21590
Collection中国科学院广州能源研究所
Affiliation中国科学院广州能源研究所
First Author AffilicationGuangZhou Institute of Energy Conversion,Chinese Academy of Sciences
Recommended Citation
GB/T 7714
胡文亮,徐刚,马健伟,等. Ti_xV_(1-x)O_2薄膜的光学及相变特性[J]. 物理化学学报,2012,028(006):1533.
APA 胡文亮,徐刚,马健伟,熊斌,&史继富.(2012).Ti_xV_(1-x)O_2薄膜的光学及相变特性.物理化学学报,028(006),1533.
MLA 胡文亮,et al."Ti_xV_(1-x)O_2薄膜的光学及相变特性".物理化学学报 028.006(2012):1533.
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