GIEC OpenIR  > 中国科学院广州能源研究所
Thickness-Dependent Structural and Optical Properties of VO2 Thin Films
Ma, Jianwei1,2; Xu, Gang1; Miao, Lei1; Tazawa, Masato3; Tanemura, Sakae4
2011-02-01
Source PublicationJAPANESE JOURNAL OF APPLIED PHYSICS
Volume50Issue:2
AbstractVO2 thin films with thicknesses from 100 to 2 nm were prepared on C-plane sapphire (0001) substrates by magnetron sputtering and remarkable thickness-dependent structural and optical properties were found. Below 10 nm, the films are nonconductive, island structured, and their phase transition temperatures are reduced to be much lower than those of the continuous, thick films. Structural defects in the island crystal films may be one of the main reasons for this temperature reduction. The film growth mode was identified to be the Vollmer-Weber (island growth)-type in the initial stage. (C) 2011 The Japan Society of Applied Physics
SubtypeArticle
WOS HeadingsScience & Technology ; Physical Sciences
DOI10.1143/JJAP.50.020215
WOS Subject ExtendedPhysics
WOS KeywordMETAL PHASE-TRANSITION ; VANADIUM DIOXIDE ; INSULATOR-TRANSITION ; RAMAN-SCATTERING ; SEMICONDUCTOR ; TEMPERATURE
Indexed BySCI
Language英语
WOS SubjectPhysics, Applied
WOS IDWOS:000287525300015
Citation statistics
Cited Times:18[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.giec.ac.cn/handle/344007/10405
Collection中国科学院广州能源研究所
Affiliation1.Chinese Acad Sci, Guangzhou Inst Energy Convers, Key Lab Renewable Energy & Gas Hydrate, Guangzhou 510640, Peoples R China
2.Chinese Acad Sci, Grad Sch, Beijing 100049, Peoples R China
3.Natl Inst Adv Ind Sci & Technol, Nagoya, Aichi 4638560, Japan
4.Japan Fine Ceram Ctr, Dept Mat Sci & Engn, Nagoya, Aichi 4568587, Japan
Recommended Citation
GB/T 7714
Ma, Jianwei,Xu, Gang,Miao, Lei,et al. Thickness-Dependent Structural and Optical Properties of VO2 Thin Films[J]. JAPANESE JOURNAL OF APPLIED PHYSICS,2011,50(2).
APA Ma, Jianwei,Xu, Gang,Miao, Lei,Tazawa, Masato,&Tanemura, Sakae.(2011).Thickness-Dependent Structural and Optical Properties of VO2 Thin Films.JAPANESE JOURNAL OF APPLIED PHYSICS,50(2).
MLA Ma, Jianwei,et al."Thickness-Dependent Structural and Optical Properties of VO2 Thin Films".JAPANESE JOURNAL OF APPLIED PHYSICS 50.2(2011).
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Ma, Jianwei]'s Articles
[Xu, Gang]'s Articles
[Miao, Lei]'s Articles
Baidu academic
Similar articles in Baidu academic
[Ma, Jianwei]'s Articles
[Xu, Gang]'s Articles
[Miao, Lei]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Ma, Jianwei]'s Articles
[Xu, Gang]'s Articles
[Miao, Lei]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.