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Preparation and characterization of Si sheets by renewed SSP technique 期刊论文
JOURNAL OF CRYSTAL GROWTH, 2004, 卷号: 270, 期号: 3-4, 页码: 446-454
Authors:  Ai, B;  Shen, H;  Ban, Q;  Wang, XJ;  Liang, ZC;  Liao, XB
Favorite  |  View/Download:151/0  |  Submit date:2016/10/27
Crystal Structure  Recrystallization  Substrates  Growth From Melt  Semiconducting Silicon