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Source Publication：JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS    Date Issued：2009

Selected(0)Clear Items/Page: 5101520253035404550556065707580859095100   Sort: SelectIssue Date AscendingIssue Date DescendingTitle AscendingTitle DescendingWOS Cited Times AscendingWOS Cited Times DescendingSubmit date AscendingSubmit date DescendingAuthor AscendingAuthor DescendingJournal Impact Factor AscendingJournal Impact Factor Descending
	Spectroscopic ellipsometry study of In2O3 thin films 期刊论文 JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2009, 卷号: 20, 期号: Suppl. 1, 页码: 71-75 Authors:  Miao, L.;  Tanemura, S.;  Cao, Y. G.;  Xu, G. Adobe PDF(376Kb)  |  Favorite  |  View/Download：1240/615  |  Submit date：2010/09/16 Optical-properties  Anatase  Growth