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Ellipsometric studies of optical properties of Er-doped ZnO thin films synthesized by sol-gel method
Miao, Lei1; Tanemura, Sakae1,2,3; Zhao, Lili1; Xiao, Xiudi1; Zhang, Xiao Ting4
2013-09-30
Source PublicationTHIN SOLID FILMS
Volume543Pages:125-129
AbstractWe have reported a low-cost and fast formation of highly efficient Er centers in ZnO thin films. As a high sensitivity tool for the detection of trace of Er dopant in ZnO film, spectroscopic ellipsometry is employed to disclose the systematic interrelationship of the crystallinity, dielectric function and optical band structure. Pure ZnO thin film shows very sharp band structure. The films with 0.05 at.% Er dopant, annealed at 600 degrees C and 800 degrees C, exhibit the similar tendency where the dopant level appears at the band tail. The band structure of the films with 0.05 at.% Er dopant, annealed at 400 degrees C, is very close to that of pure ZnO. While the samples annealed at 1000 degrees C are on the verge of amorphousness, and the flat curve of photon energy dependent epsilon(i)(E) is observed. The strain effect caused by the formation of ErO6 pseudo-octahedron structure greatly affects the value of dielectric constants. Therefore, SE analyses reveal significant effect of Er doping and annealing temperatures on the modification of optical band structure, dielectric property and optically active center in ZnO films. (C) 2013 Elsevier B.V. All rights reserved.
SubtypeArticle
KeywordZno:Er Thin Films Spectroscopic Ellipsometry Dielectric Function Optical Band-gap Urbach Tail
WOS HeadingsScience & Technology ; Technology ; Physical Sciences
DOI10.1016/j.tsf.2013.02.034
WOS Subject ExtendedMaterials Science ; Physics
WOS KeywordP-TYPE CONDUCTION ; BAND-GAP ; ELECTRONIC-STRUCTURE ; SEMICONDUCTORS ; LUMINESCENCE ; CRYSTALLINE ; SHIFT ; LASER
Indexed BySCI ; ISTP
Language英语
WOS SubjectMaterials Science, Multidisciplinary ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter
WOS IDWOS:000324049500029
Citation statistics
Cited Times:12[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.giec.ac.cn/handle/344007/10034
Collection中国科学院广州能源研究所
Affiliation1.Chinese Acad Sci, Guangzhou Inst Energy Convers, Key Lab Renewable Energy & Gas Hydrate, Guangzhou 510640, Guangdong, Peoples R China
2.Japan Fine Ceram Ctr, Atsuta Ku, Nagoya, Aichi 4568587, Japan
3.Nagoya Inst Technol, Powder Technol Lab, Showa Ku, Nagoya, Aichi 4668555, Japan
4.Henan Univ Urban Construct, Dept Civil & Mat Engn, Pingdingshan 467036, Henan, Peoples R China
Recommended Citation
GB/T 7714
Miao, Lei,Tanemura, Sakae,Zhao, Lili,et al. Ellipsometric studies of optical properties of Er-doped ZnO thin films synthesized by sol-gel method[J]. THIN SOLID FILMS,2013,543:125-129.
APA Miao, Lei,Tanemura, Sakae,Zhao, Lili,Xiao, Xiudi,&Zhang, Xiao Ting.(2013).Ellipsometric studies of optical properties of Er-doped ZnO thin films synthesized by sol-gel method.THIN SOLID FILMS,543,125-129.
MLA Miao, Lei,et al."Ellipsometric studies of optical properties of Er-doped ZnO thin films synthesized by sol-gel method".THIN SOLID FILMS 543(2013):125-129.
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